No. |
Part Number |
Image |
Manufacturer |
Description |
Action |
351 |
NB7L216MNG |
|
ON Semiconductor |
Differential Receiver/Driver IC 16-QFN (3x3) |
|
352 |
SN74ABT18640DGGR |
|
Texas Instruments |
Scan Test Device with Inverting Bus Transceivers IC 56-TSSOP |
|
353 |
SN74ABTH16460DGGR |
|
Texas Instruments |
4-TO-1 Multiplexed/Demultiplexed Transceivers IC 56-TSSOP |
|
354 |
SN74FB2041ARC |
|
Texas Instruments |
TTL/BTL Transceiver/Translator IC 52-QFP (10x10) |
|
355 |
SN74FB1653PCA |
|
Texas Instruments |
LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line IC 100-HLQFP (14x14) |
|
356 |
MC100EP116MNG |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-QFN (5x5) |
|
357 |
NB7VQ1006MMNTXG |
|
ON Semiconductor |
Equalizer Receiver IC 24-QFN (4x4) |
|
358 |
SN74FB2040RCG3 |
|
Texas Instruments |
TTL/BTL Transceiver/Translator IC 52-QFP (10x10) |
|
359 |
ISL55100AIRZ-T |
|
Intersil |
Comparator, Driver IC 72-QFN (10x10) |
|
360 |
SN54LS181J |
|
Texas Instruments |
Arithmetic Logic Unit IC 24-CDIP |
|
361 |
MC100EP17MNG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-QFN (4x4) |
|
362 |
SN74ABTH182652APM |
|
Texas Instruments |
Scan Test Device With Transceivers And Registers IC 64-LQFP (10x10) |
|
363 |
SN74FB2031RCG3 |
|
Texas Instruments |
TTL/BTL Transceiver/Translator IC 52-QFP (10x10) |
|
364 |
MC10EP116FAG |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-LQFP (7x7) |
|
365 |
SSTU32865ET/G,551 |
|
NXP Semiconductors |
1:2 Registered Buffer with Parity IC 160-TFBGA (9x13) |
|
366 |
SSTU32865ET/G,557 |
|
NXP Semiconductors |
1:2 Registered Buffer with Parity IC 160-TFBGA (9x13) |
|
367 |
SSTU32865ET/G,518 |
|
NXP Semiconductors |
1:2 Registered Buffer with Parity IC 160-TFBGA (9x13) |
|
368 |
SSTUA32864EC/G,551 |
|
NXP Semiconductors |
1:1, 1:2 Configurable Registered Buffer IC 96-LFBGA (13.5x5.5) |
|
369 |
SSTUA32864EC/G,557 |
|
NXP Semiconductors |
1:1, 1:2 Configurable Registered Buffer IC 96-LFBGA (13.5x5.5) |
|
370 |
SSTUA32864EC/G,518 |
|
NXP Semiconductors |
1:1, 1:2 Configurable Registered Buffer IC 96-LFBGA (13.5x5.5) |
|
371 |
N74F656AD,602 |
|
NXP Semiconductors |
Buffer/Driver with Parity IC 24-SO |
|
372 |
SN74LS297N |
|
Texas Instruments |
Digital Phase-Locked-Loop Filters IC 16-PDIP |
|
373 |
SN74FB1651PCA |
|
Texas Instruments |
TTL/BTL Universal Storage Transceiver with Buffered Clock Line IC 100-HLQFP (14x14) |
|
374 |
NB7VQ1006MMNG |
|
ON Semiconductor |
Equalizer Receiver IC 24-QFN (4x4) |
|
375 |
MAX9963AJCCQ+TD |
|
Maxim Integrated |
Comparator, Driver IC 100-TQFP (14x14) |
|
376 |
MAX9963BGCCQ+TD |
|
Maxim Integrated |
Comparator, Driver IC 100-TQFP (14x14) |
|
377 |
SN74FB1650PCA |
|
Texas Instruments |
TTL/BTL Universal Storage Transceiver IC 100-HLQFP (14x14) |
|
378 |
MC100EP17DWG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-SOIC |
|
379 |
MC10EP17MNG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-QFN (4x4) |
|
380 |
NB100LVEP17MNG |
|
ON Semiconductor |
Differential Receiver/Driver IC 24-QFN (4x4) |
|
381 |
MC10EP17DWG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-SOIC |
|
382 |
SN74LVTH18646APMG4 |
|
Texas Instruments |
ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
|
383 |
SN74LVTH182646APM |
|
Texas Instruments |
ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
|
384 |
SY58016LMG |
|
Microchip Technology |
Differential Receiver/Driver IC 16-MLF? (3x3) |
|
385 |
SN74ABT18502PMR |
|
Texas Instruments |
Scan Test Device with Registered Bus Transceiver IC 64-LQFP (10x10) |
|
386 |
SN74ABT18504PMG4 |
|
Texas Instruments |
Scan Test Device with Universal Bus Transceivers IC 64-LQFP (10x10) |
|
387 |
MC100EP17DWR2G |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-SOIC |
|
388 |
SN74SSQE32882ZCJR |
|
Texas Instruments |
1:2 Registered Buffer with Parity IC 176-BGA |
|
389 |
LM9780CCVS/NOPB |
|
Texas Instruments |
NON-STANDARD PART CALL FIRST |
|
390 |
SN74ABTE16246DLG4 |
|
Texas Instruments |
Incident-Wave Switching Bus Transceivers IC 48-SSOP |
|
391 |
MC100EP116MNR4G |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-QFN (5x5) |
|
392 |
SN74ABT8652DLG4 |
|
Texas Instruments |
Scan Test Device with Bus Transceiver and Registers IC 28-SSOP |
|
393 |
MC10EP116FAR2G |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-LQFP (7x7) |
|
394 |
MC100EP116FAR2G |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-LQFP (7x7) |
|
395 |
MC100EP16TDG |
|
ON Semiconductor |
Differential Receiver/Driver IC 8-SOIC |
|
396 |
SN74SSTVF32852KR |
|
Texas Instruments |
Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) |
|
397 |
MC10E416FNG |
|
ON Semiconductor |
Differential Receiver IC 28-PLCC (11.51x11.51) |
|
398 |
MC100E116FNG |
|
ON Semiconductor |
Differential Receiver IC 28-PLCC (11.51x11.51) |
|
399 |
MC100EP116FAG |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-LQFP (7x7) |
|
400 |
NB100LVEP17DTG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-TSSOP |
|