Logic - Specialty Logic - Integrated Circuits (ICs) - Electronic Components
| No. | Part Number | Image | Manufacturer | Description | Action |
|---|---|---|---|---|---|
| 101 | SN74LVC1GX04DBVT | ![]() |
Texas Instruments | Crystal Oscillator Driver IC SOT-23-6 | ![]() |
| 102 | CD74HC283M | ![]() |
Texas Instruments | Binary Full Adder with Fast Carry IC 16-SOIC | ![]() |
| 103 | MC100EP17DTG | ![]() |
ON Semiconductor | Differential Receiver/Driver IC 20-TSSOP | ![]() |
| 104 | CD74HCT283M | ![]() |
Texas Instruments | Binary Full Adder with Fast Carry IC 16-SOIC | ![]() |
| 105 | SN74F283D | ![]() |
Texas Instruments | Binary Full Adder with Fast Carry IC 16-SOIC | ![]() |
| 106 | SN74LVT8996PW | ![]() |
Texas Instruments | Addressable Scan Ports IC 24-TSSOP | ![]() |
| 107 | MC100EP16FDTG | ![]() |
ON Semiconductor | Differential Receiver/Driver IC 8-TSSOP | ![]() |
| 108 | SN74TVC3010PW | ![]() |
Texas Instruments | Voltage Clamp IC 24-TSSOP | ![]() |
| 109 | CD74AC283E | ![]() |
Texas Instruments | Binary Full Adder with Fast Carry IC 16-PDIP | ![]() |
| 110 | CSSTV32867SGKEREP | ![]() |
Texas Instruments | Registered Buffer with SSTL_2 Compatible I/O for DDR IC 96-LFBGA (13.5x5.5) | ![]() |
| 111 | SN74ABT18504PM | ![]() |
Texas Instruments | Scan Test Device with Universal Bus Transceivers IC 64-LQFP (10x10) | ![]() |
| 112 | SN74LVT8996IPWREP | ![]() |
Texas Instruments | Addressable Scan Ports IC 24-TSSOP | ![]() |
| 113 | 74SSTVF32852ZKFR | ![]() |
Texas Instruments | Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) | ![]() |
| 114 | 74SSTUB32868AZRHR | ![]() |
Texas Instruments | 1:2 Configurable Registered Buffer with Parity IC 176-NFBGA (6x15) | ![]() |
| 115 | SN74SSTU32864GKER | ![]() |
Texas Instruments | 1:1, 1:2 Configurable Registered Buffer IC 96-LFBGA (13.5x5.5) | ![]() |
| 116 | 74SSTUB32865ZJBR | ![]() |
Texas Instruments | 1:2 Registered Buffer with Parity IC 160-NFBGA (9x13) | ![]() |
| 117 | 74SSTUB32865AZJBR | ![]() |
Texas Instruments | 1:2 Registered Buffer with Parity IC 160-NFBGA (9x13) | ![]() |
| 118 | SN74LS31N | ![]() |
Texas Instruments | Delay Element IC 16-PDIP | ![]() |
| 119 | SN74LVTH18652APM | ![]() |
Texas Instruments | ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) | ![]() |
| 120 | SN74LVTH182652APM | ![]() |
Texas Instruments | ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) | ![]() |
| 121 | SN74LVTH18646APM | ![]() |
Texas Instruments | ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) | ![]() |
| 122 | SN74LVT8996PWR | ![]() |
Texas Instruments | Addressable Scan Ports IC 24-TSSOP | ![]() |
| 123 | SN74LVT8980AIDWREP | ![]() |
Texas Instruments | Embedded Test-Bus Controllers IC 24-SOIC | ![]() |
| 124 | SN74ABT8652DL | ![]() |
Texas Instruments | Scan Test Device with Bus Transceiver and Registers IC 28-SSOP | ![]() |
| 125 | SN74ABT18640DL | ![]() |
Texas Instruments | Scan Test Device with Inverting Bus Transceivers IC 56-SSOP | ![]() |
| 126 | SN74ABTE16246DLR | ![]() |
Texas Instruments | Incident-Wave Switching Bus Transceivers IC 48-SSOP | ![]() |
| 127 | SN74ABT8543DW | ![]() |
Texas Instruments | Scan Test Device with Registered Bus Transceiver IC 28-SOIC | ![]() |
| 128 | SN74SSTU32864DZKER | ![]() |
Texas Instruments | 1:1, 1:2 Configurable Registered Buffer IC 96-PBGA MICROSTAR (13.6x5.6) | ![]() |
| 129 | SN74SSTV32852GKFR | ![]() |
Texas Instruments | Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) | ![]() |
| 130 | SN74SSTV32852ZKFR | ![]() |
Texas Instruments | Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) | ![]() |
| 131 | CSSTV32852GKFREP | ![]() |
Texas Instruments | Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) | ![]() |
| 132 | SN74ABT18245ADGGR | ![]() |
Texas Instruments | Scan Test Device with Bus Transceivers IC 56-TSSOP | ![]() |
| 133 | SN74LVTH182502APM | ![]() |
Texas Instruments | ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) | ![]() |
| 134 | SN74LVTH18504APM | ![]() |
Texas Instruments | ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) | ![]() |
| 135 | SN74SSTUB32864ZKER | ![]() |
Texas Instruments | 1:1, 1:2 Configurable Registered Buffer IC 96-PBGA MICROSTAR (13.6x5.6) | ![]() |
| 136 | 74SSTUB32866AZKER | ![]() |
Texas Instruments | 1:1, 1:2 Configurable Registered Buffer with Parity IC 96-PBGA MICROSTAR (13.6x5.6) | ![]() |
| 137 | 74SSTUB32868ZRHR | ![]() |
Texas Instruments | 1:2 Configurable Registered Buffer with Parity IC 176-NFBGA (6x15) | ![]() |
| 138 | SN74SSTU32864CZKER | ![]() |
Texas Instruments | 1:1, 1:2 Configurable Registered Buffer IC 96-PBGA MICROSTAR (13.6x5.6) | ![]() |
| 139 | SN74SSTU32864ZKER | ![]() |
Texas Instruments | 1:1, 1:2 Configurable Registered Buffer IC 96-PBGA MICROSTAR (13.6x5.6) | ![]() |
| 140 | SN74LVTH18504APMR | ![]() |
Texas Instruments | ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) | ![]() |
| 141 | SN74SSTV16859RGQR | ![]() |
Texas Instruments | Registered Buffer with SSTL_2 Compatible I/O for DDR IC 56-VQFN (8x8) | ![]() |
| 142 | SN74SSQEB32882ZALR | ![]() |
Texas Instruments | 1:2 Registered Buffer with Parity IC 176-NFBGA (13.5x8) | ![]() |
| 143 | SN74SSQEC32882ZALR | ![]() |
Texas Instruments | 1:2 Registered Buffer with Parity IC 176-NFBGA (13.5x8) | ![]() |
| 144 | SN74SSQEA32882ZALR | ![]() |
Texas Instruments | 1:2 Registered Buffer with Parity IC 176-NFBGA (13.5x8) | ![]() |
| 145 | SN74ABT18245ADLR | ![]() |
Texas Instruments | Scan Test Device with Bus Transceivers IC 56-SSOP | ![]() |
| 146 | SN74ABT8646DL | ![]() |
Texas Instruments | Scan Test Device with Bus Transceiver and Registers IC 28-SSOP | ![]() |
| 147 | SN74ABT8646DW | ![]() |
Texas Instruments | Scan Test Device with Bus Transceiver and Registers IC 28-SOIC | ![]() |
| 148 | SN74SSTEB32866ZWLR | ![]() |
Texas Instruments | Configurable Buffer with Address-Parity Test IC 96-PBGA (13.6x5.6) | ![]() |
| 149 | SN74LVTH182504APM | ![]() |
Texas Instruments | ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) | ![]() |
| 150 | SN74SSTVF16859GR | ![]() |
Texas Instruments | Registered Buffer with SSTL_2 Compatible I/O for DDR IC 64-TSSOP | ![]() |







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