| No. |
Part Number |
Image |
Manufacturer |
Description |
Action |
| 351 |
NB7L216MNG |
 |
ON Semiconductor |
Differential Receiver/Driver IC 16-QFN (3x3) |
  |
| 352 |
SN74ABT18640DGGR |
|
Texas Instruments |
Scan Test Device with Inverting Bus Transceivers IC 56-TSSOP |
|
| 353 |
SN74ABTH16460DGGR |
|
Texas Instruments |
4-TO-1 Multiplexed/Demultiplexed Transceivers IC 56-TSSOP |
|
| 354 |
SN74FB2041ARC |
|
Texas Instruments |
TTL/BTL Transceiver/Translator IC 52-QFP (10x10) |
|
| 355 |
SN74FB1653PCA |
|
Texas Instruments |
LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line IC 100-HLQFP (14x14) |
|
| 356 |
MC100EP116MNG |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-QFN (5x5) |
|
| 357 |
NB7VQ1006MMNTXG |
|
ON Semiconductor |
Equalizer Receiver IC 24-QFN (4x4) |
|
| 358 |
SN74FB2040RCG3 |
|
Texas Instruments |
TTL/BTL Transceiver/Translator IC 52-QFP (10x10) |
|
| 359 |
ISL55100AIRZ-T |
|
Intersil |
Comparator, Driver IC 72-QFN (10x10) |
|
| 360 |
SN54LS181J |
|
Texas Instruments |
Arithmetic Logic Unit IC 24-CDIP |
|
| 361 |
MC100EP17MNG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-QFN (4x4) |
|
| 362 |
SN74ABTH182652APM |
|
Texas Instruments |
Scan Test Device With Transceivers And Registers IC 64-LQFP (10x10) |
|
| 363 |
SN74FB2031RCG3 |
|
Texas Instruments |
TTL/BTL Transceiver/Translator IC 52-QFP (10x10) |
|
| 364 |
MC10EP116FAG |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-LQFP (7x7) |
|
| 365 |
SSTU32865ET/G,551 |
|
NXP Semiconductors |
1:2 Registered Buffer with Parity IC 160-TFBGA (9x13) |
|
| 366 |
SSTU32865ET/G,557 |
|
NXP Semiconductors |
1:2 Registered Buffer with Parity IC 160-TFBGA (9x13) |
|
| 367 |
SSTU32865ET/G,518 |
|
NXP Semiconductors |
1:2 Registered Buffer with Parity IC 160-TFBGA (9x13) |
|
| 368 |
SSTUA32864EC/G,551 |
|
NXP Semiconductors |
1:1, 1:2 Configurable Registered Buffer IC 96-LFBGA (13.5x5.5) |
|
| 369 |
SSTUA32864EC/G,557 |
|
NXP Semiconductors |
1:1, 1:2 Configurable Registered Buffer IC 96-LFBGA (13.5x5.5) |
|
| 370 |
SSTUA32864EC/G,518 |
|
NXP Semiconductors |
1:1, 1:2 Configurable Registered Buffer IC 96-LFBGA (13.5x5.5) |
|
| 371 |
N74F656AD,602 |
|
NXP Semiconductors |
Buffer/Driver with Parity IC 24-SO |
|
| 372 |
SN74LS297N |
|
Texas Instruments |
Digital Phase-Locked-Loop Filters IC 16-PDIP |
|
| 373 |
SN74FB1651PCA |
|
Texas Instruments |
TTL/BTL Universal Storage Transceiver with Buffered Clock Line IC 100-HLQFP (14x14) |
|
| 374 |
NB7VQ1006MMNG |
|
ON Semiconductor |
Equalizer Receiver IC 24-QFN (4x4) |
|
| 375 |
MAX9963AJCCQ+TD |
|
Maxim Integrated |
Comparator, Driver IC 100-TQFP (14x14) |
|
| 376 |
MAX9963BGCCQ+TD |
|
Maxim Integrated |
Comparator, Driver IC 100-TQFP (14x14) |
|
| 377 |
SN74FB1650PCA |
|
Texas Instruments |
TTL/BTL Universal Storage Transceiver IC 100-HLQFP (14x14) |
|
| 378 |
MC100EP17DWG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-SOIC |
|
| 379 |
MC10EP17MNG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-QFN (4x4) |
|
| 380 |
NB100LVEP17MNG |
|
ON Semiconductor |
Differential Receiver/Driver IC 24-QFN (4x4) |
|
| 381 |
MC10EP17DWG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-SOIC |
|
| 382 |
SN74LVTH18646APMG4 |
|
Texas Instruments |
ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
|
| 383 |
SN74LVTH182646APM |
|
Texas Instruments |
ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10) |
|
| 384 |
SY58016LMG |
|
Microchip Technology |
Differential Receiver/Driver IC 16-MLF? (3x3) |
|
| 385 |
SN74ABT18502PMR |
|
Texas Instruments |
Scan Test Device with Registered Bus Transceiver IC 64-LQFP (10x10) |
|
| 386 |
SN74ABT18504PMG4 |
|
Texas Instruments |
Scan Test Device with Universal Bus Transceivers IC 64-LQFP (10x10) |
|
| 387 |
MC100EP17DWR2G |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-SOIC |
|
| 388 |
SN74SSQE32882ZCJR |
|
Texas Instruments |
1:2 Registered Buffer with Parity IC 176-BGA |
|
| 389 |
LM9780CCVS/NOPB |
|
Texas Instruments |
NON-STANDARD PART CALL FIRST |
|
| 390 |
SN74ABTE16246DLG4 |
|
Texas Instruments |
Incident-Wave Switching Bus Transceivers IC 48-SSOP |
|
| 391 |
MC100EP116MNR4G |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-QFN (5x5) |
|
| 392 |
SN74ABT8652DLG4 |
|
Texas Instruments |
Scan Test Device with Bus Transceiver and Registers IC 28-SSOP |
|
| 393 |
MC10EP116FAR2G |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-LQFP (7x7) |
|
| 394 |
MC100EP116FAR2G |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-LQFP (7x7) |
|
| 395 |
MC100EP16TDG |
|
ON Semiconductor |
Differential Receiver/Driver IC 8-SOIC |
|
| 396 |
SN74SSTVF32852KR |
|
Texas Instruments |
Registered Buffer with SSTL_2 Compatible I/O for DDR IC 114-BGA MICROSTAR (16x5.5) |
|
| 397 |
MC10E416FNG |
|
ON Semiconductor |
Differential Receiver IC 28-PLCC (11.51x11.51) |
|
| 398 |
MC100E116FNG |
|
ON Semiconductor |
Differential Receiver IC 28-PLCC (11.51x11.51) |
|
| 399 |
MC100EP116FAG |
|
ON Semiconductor |
Differential Receiver/Driver IC 32-LQFP (7x7) |
|
| 400 |
NB100LVEP17DTG |
|
ON Semiconductor |
Differential Receiver/Driver IC 20-TSSOP |
|
Start With
Include With
